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买了大半年才写6t就boom了的渣渣东芝盘……现在每次断电再开机都会变成未初始化状态，别说装系统了当u盘都不行……买回来时候煞笔西西的把贴纸撕了现在还没得保……
=== START OF INFORMATION SECTION ===
Device Model: TOSHIBA THNSNJ256GMCT
Serial Number: 73OS101KTVAY
LU WWN Device Id: 5 00080d b1004cd2d
Firmware Version: JTBA00@B
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: < 1.8 inches
Device is: Not in smartctl database [for details use: -P
showall]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Fri Dec 04 17:30:01 2015
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
ATA Security is: Disabled, NOT FROZEN [SEC1]
Write SCT (Get) Feature Control Command failed: Input/output error
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
Device Model: TOSHIBA THNSNJ256GMCT
Serial Number: 73OS101KTVAY
LU WWN Device Id: 5 00080d b1004cd2d
Firmware Version: JTBA00@B
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: < 1.8 inches
Device is: Not in smartctl database [for details use: -P
showall]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Fri Dec 04 17:30:01 2015
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
ATA Security is: Disabled, NOT FROZEN [SEC1]
Write SCT (Get) Feature Control Command failed: Input/output error
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection
activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine
completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before
entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 10) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -O-R-- 100 100 000 - 0
2 Throughput_Performance P-S--- 100 100 050 - 0
3 Spin_Up_Time POS--- 100 100 050 - 0
5 Reallocated_Sector_Ct PO--C- 100 100 050 - 0
7 Unknown_SSD_Attribute PO-R-- 100 100 050 - 0
8 Unknown_SSD_Attribute P-S--- 100 100 050 - 0
9 Power_On_Hours -O--C- 100 100 000 - 5634
10 Unknown_SSD_Attribute PO--C- 100 100 050 - 0
12 Power_Cycle_Count -O--C- 100 100 000 - 1208
167 Unknown_Attribute -O---K 100 100 000 - 0
168 Unknown_Attribute -O--C- 100 100 000 - 1
169 Unknown_Attribute PO--C- 100 100 010 - 100
170 Unknown_Attribute PO--C- 100 100 010 - 0
173 Unknown_Attribute -O--C- 196 196 000 - 0
175 Program_Fail_Count_Chip PO--C- 100 100 010 - 0
192 Power-Off_Retract_Count -O--C- 100 100 000 - 72
194 Temperature_Celsius -O---K 062 036 000 - 38
(Min/Max 18/64)
197 Current_Pending_Sector -O--C- 100 100 000 - 0
240 Unknown_SSD_Attribute PO--C- 100 100 050 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 64 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (64 sectors)
Device Error Count: 1
CR = Command Register
FEATR = Features Register
COUNT = Count (was: Sector Count) Register
LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8
LH = LBA High (was: Cylinder High) Register ] LBA
LM = LBA Mid (was: Cylinder Low) Register ] Register
LL = LBA Low (was: Sector Number) Register ]
DV = Device (was: Device/Head) Register
DC = Device Control Register
ER = Error register
ST = Status register
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 [0] occurred at disk power-on lifetime: 3708 hours (154 days +
12 hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
84 -- 51 00 f8 00 00 00 5f f2 90 40 00 Error: ICRC, ABRT at LBA =
0x005ff290 = 6288016
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time
Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- ---------------
--------------------
61 00 10 00 f8 00 00 00 5f f2 90 40 00 00:00:36.494 WRITE FPDMA
QUEUED
61 00 08 00 f0 00 00 11 b8 d0 28 40 00 00:00:35.746 WRITE FPDMA
QUEUED
61 00 08 00 e8 00 00 00 ad 8b 00 40 00 00:00:35.746 WRITE FPDMA
QUEUED
2f 00 00 00 01 00 00 00 00 00 10 40 00 00:00:35.745 READ LOG
EXT
ae 00 20 00 97 d9 00 06 20 4e ac 40 00 00:00:35.745 [RESERVED]
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime
(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 5628
-
# 2 Short offline Aborted by host 00% 2
-
# 3 Short offline Aborted by host 00% 2
-
# 4 Short offline Completed without error 00% 2
-
# 5 Short offline Completed without error 00% 2
-
# 6 Short offline Completed without error 00% 2
-
# 7 Short offline Completed without error 00% 2
-
# 8 Short offline Completed without error 00% 2
-
# 9 Short offline Completed without error 00% 2
-
#10 Short offline Completed without error 00% 2
-
#11 Short offline Completed without error 00% 2
-
#12 Short offline Completed without error 00% 2
-
#13 Short offline Completed without error 00% 2
-
#14 Short offline Completed without error 00% 2
-
#15 Short offline Completed without error 00% 2
-
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute
delay.
SCT Status Version: 3
SCT Version (vendor specific): 3 (0x0003)
SCT Support Level: 0
Device State: Active (0)
Current Temperature: 38 Celsius
Power Cycle Min/Max Temperature: 25/39 Celsius
Lifetime Min/Max Temperature: 18/64 Celsius
Under/Over Temperature Limit Count: 0/0
Write SCT Data Table failed: Input/output error
Read SCT Temperature History failed
Write SCT (Get) Error Recovery Control Command failed: Input/output
error
SCT (Get) Error Recovery Control command failed
Device Statistics (GP Log 0x04)
Page Offset Size Value Description
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection
activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine
completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before
entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 10) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -O-R-- 100 100 000 - 0
2 Throughput_Performance P-S--- 100 100 050 - 0
3 Spin_Up_Time POS--- 100 100 050 - 0
5 Reallocated_Sector_Ct PO--C- 100 100 050 - 0
7 Unknown_SSD_Attribute PO-R-- 100 100 050 - 0
8 Unknown_SSD_Attribute P-S--- 100 100 050 - 0
9 Power_On_Hours -O--C- 100 100 000 - 5634
10 Unknown_SSD_Attribute PO--C- 100 100 050 - 0
12 Power_Cycle_Count -O--C- 100 100 000 - 1208
167 Unknown_Attribute -O---K 100 100 000 - 0
168 Unknown_Attribute -O--C- 100 100 000 - 1
169 Unknown_Attribute PO--C- 100 100 010 - 100
170 Unknown_Attribute PO--C- 100 100 010 - 0
173 Unknown_Attribute -O--C- 196 196 000 - 0
175 Program_Fail_Count_Chip PO--C- 100 100 010 - 0
192 Power-Off_Retract_Count -O--C- 100 100 000 - 72
194 Temperature_Celsius -O---K 062 036 000 - 38
(Min/Max 18/64)
197 Current_Pending_Sector -O--C- 100 100 000 - 0
240 Unknown_SSD_Attribute PO--C- 100 100 050 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 64 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (64 sectors)
Device Error Count: 1
CR = Command Register
FEATR = Features Register
COUNT = Count (was: Sector Count) Register
LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8
LH = LBA High (was: Cylinder High) Register ] LBA
LM = LBA Mid (was: Cylinder Low) Register ] Register
LL = LBA Low (was: Sector Number) Register ]
DV = Device (was: Device/Head) Register
DC = Device Control Register
ER = Error register
ST = Status register
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 [0] occurred at disk power-on lifetime: 3708 hours (154 days +
12 hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
84 -- 51 00 f8 00 00 00 5f f2 90 40 00 Error: ICRC, ABRT at LBA =
0x005ff290 = 6288016
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time
Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- ---------------
--------------------
61 00 10 00 f8 00 00 00 5f f2 90 40 00 00:00:36.494 WRITE FPDMA
QUEUED
61 00 08 00 f0 00 00 11 b8 d0 28 40 00 00:00:35.746 WRITE FPDMA
QUEUED
61 00 08 00 e8 00 00 00 ad 8b 00 40 00 00:00:35.746 WRITE FPDMA
QUEUED
2f 00 00 00 01 00 00 00 00 00 10 40 00 00:00:35.745 READ LOG
EXT
ae 00 20 00 97 d9 00 06 20 4e ac 40 00 00:00:35.745 [RESERVED]
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime
(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 5628
-
# 2 Short offline Aborted by host 00% 2
-
# 3 Short offline Aborted by host 00% 2
-
# 4 Short offline Completed without error 00% 2
-
# 5 Short offline Completed without error 00% 2
-
# 6 Short offline Completed without error 00% 2
-
# 7 Short offline Completed without error 00% 2
-
# 8 Short offline Completed without error 00% 2
-
# 9 Short offline Completed without error 00% 2
-
#10 Short offline Completed without error 00% 2
-
#11 Short offline Completed without error 00% 2
-
#12 Short offline Completed without error 00% 2
-
#13 Short offline Completed without error 00% 2
-
#14 Short offline Completed without error 00% 2
-
#15 Short offline Completed without error 00% 2
-
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute
delay.
SCT Status Version: 3
SCT Version (vendor specific): 3 (0x0003)
SCT Support Level: 0
Device State: Active (0)
Current Temperature: 38 Celsius
Power Cycle Min/Max Temperature: 25/39 Celsius
Lifetime Min/Max Temperature: 18/64 Celsius
Under/Over Temperature Limit Count: 0/0
Write SCT Data Table failed: Input/output error
Read SCT Temperature History failed
Write SCT (Get) Error Recovery Control Command failed: Input/output
error
SCT (Get) Error Recovery Control command failed
Device Statistics (GP Log 0x04)
Page Offset Size Value Description
1 ===== = = == General Statistics (rev 2) ==
1 0x008 4 1208 Lifetime Power-On Resets
1 0x018 6 13578871948 Logical Sectors Written
1 0x020 6 328189034 Number of Write Commands
1 0x028 6 10966697265 Logical Sectors Read
1 0x030 6 194059255 Number of Read Commands
4 ===== = = == General Errors Statistics (rev 1)
==
4 0x008 4 0 Number of Reported Uncorrectable
Errors
4 0x010 4 0 Resets Between Cmd Acceptance and
Completion
5 ===== = = == Temperature Statistics (rev 1) ==
5 0x008 1 38 Current Temperature
5 0x010 1 43 Average Short Term Temperature
5 0x018 1 42 Average Long Term Temperature
5 0x020 1 61 Highest Temperature
5 0x028 1 27 Lowest Temperature
5 0x030 1 52 Highest Average Short Term Temperature
5 0x038 1 30 Lowest Average Short Term Temperature
5 0x040 1 46 Highest Average Long Term Temperature
5 0x048 1 42 Lowest Average Long Term Temperature
5 0x050 4 280310 Time in Over-Temperature
5 0x058 1 40 Specified Maximum Operating
Temperature
5 0x060 4 0 Time in Under-Temperature
5 0x068 1 5 Specified Minimum Operating
Temperature
6 ===== = = == Transport Statistics (rev 1) ==
6 0x008 4 1747 Number of Hardware Resets
6 0x018 4 1 Number of Interface CRC Errors
7 ===== = = == Solid State Device Statistics (rev
1) ==
7 0x008 1 4~ Percentage Used Endurance Indicator
|_ ~ normalized value
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 4 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 4 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 4 61 Transition from drive PhyRdy to drive PhyNRdy
0x000a 4 3 Device-to-host register FISes sent due to a
COMRESET
0x000b 4 0 CRC errors within host-to-device FIS
0x000d 4 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS,
CRC
0x0010 2 0 R_ERR response for host-to-device data FIS,
non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data
FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data
FIS, non-CRC
1 0x008 4 1208 Lifetime Power-On Resets
1 0x018 6 13578871948 Logical Sectors Written
1 0x020 6 328189034 Number of Write Commands
1 0x028 6 10966697265 Logical Sectors Read
1 0x030 6 194059255 Number of Read Commands
4 ===== = = == General Errors Statistics (rev 1)
==
4 0x008 4 0 Number of Reported Uncorrectable
Errors
4 0x010 4 0 Resets Between Cmd Acceptance and
Completion
5 ===== = = == Temperature Statistics (rev 1) ==
5 0x008 1 38 Current Temperature
5 0x010 1 43 Average Short Term Temperature
5 0x018 1 42 Average Long Term Temperature
5 0x020 1 61 Highest Temperature
5 0x028 1 27 Lowest Temperature
5 0x030 1 52 Highest Average Short Term Temperature
5 0x038 1 30 Lowest Average Short Term Temperature
5 0x040 1 46 Highest Average Long Term Temperature
5 0x048 1 42 Lowest Average Long Term Temperature
5 0x050 4 280310 Time in Over-Temperature
5 0x058 1 40 Specified Maximum Operating
Temperature
5 0x060 4 0 Time in Under-Temperature
5 0x068 1 5 Specified Minimum Operating
Temperature
6 ===== = = == Transport Statistics (rev 1) ==
6 0x008 4 1747 Number of Hardware Resets
6 0x018 4 1 Number of Interface CRC Errors
7 ===== = = == Solid State Device Statistics (rev
1) ==
7 0x008 1 4~ Percentage Used Endurance Indicator
|_ ~ normalized value
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 4 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 4 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 4 61 Transition from drive PhyRdy to drive PhyNRdy
0x000a 4 3 Device-to-host register FISes sent due to a
COMRESET
0x000b 4 0 CRC errors within host-to-device FIS
0x000d 4 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS,
CRC
0x0010 2 0 R_ERR response for host-to-device data FIS,
non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data
FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data
FIS, non-CRC
巨型缓存盘成就看来是真get了……
我肛交没救了
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